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Chapter 11 Analog and Mixed-Signal Testing 1 VLSI Test Principles and Architectures EE141 Chap. 11 - Analog and Mixed-Signal Testing - P.1 What is this chapter about? Introduces AMS circuits, failure modes and fault models. Addresses analog testing, including DC and AC parametric testi
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  EE141 1   VLSI Test Principles and ArchitecturesChap. 11 -Analog and Mixed-Signal Testing -P.1 Chapter Chapter 1111 Analog and MixedAnalog and Mixed--Signal TestingSignal Testing  EE141 2   VLSI Test Principles and ArchitecturesChap. 11 -Analog and Mixed-Signal Testing -P.2 What is this chapter about? What is this chapter about?   Introduces AMS circuits, failure modes and fault models.  Addresses analog testing, including DC and AC parametric testing.  Discusses mixed-signal circuits, ADC and DAC, and their testing approaches.  Studies IEEE Std. 1149.4, the standard for mixed-signal test buses  EE141 3   VLSI Test Principles and ArchitecturesChap. 11 -Analog and Mixed-Signal Testing -P.3 Chapter 11Chapter 11 Analog and Mixed  Analog and Mixed - - Signal Testing Signal Testing   Introduction  Analog Circuit Testing  Mixed-Signal Testing  IEEE Std. 1149.4 Standard for Mixed-Signal Test Bus  Concluding Remarks  EE141 4   VLSI Test Principles and ArchitecturesChap. 11 -Analog and Mixed-Signal Testing -P.4 11.1 Introduction11.1 Introduction  Analog Circuit Properties  Analog Defect Mechanism and Fault Models

RH Estratégico

Apr 16, 2018
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